Early X-ray Mapping in Electron Probe Microanalysis
نویسندگان
چکیده
منابع مشابه
Characterization of atmospheric particles by electron probe X-ray microanalysis.
Microchemical glass standards were used to validate a quantitation method based on peak-to-background (P/B) ratios from electron probe x-ray microanalysis spectra. This standardless method was applied to the determination of concentrations of individual particles from Malpha or Lalpha lines, as well as from Kalpha lines. The algorithm was tested on particulate glass samples for diameters rangin...
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Three methods have been used to prepare cultured cells for electron probe X-ray microanalysis (EPXMA): (1) analysis at the subcellular level of freeze-dried ultrathin cryosections with scanning transmission electron microscopy (STEM); (2) analysis at the cellular level of whole freeze-dried cells with STEM; and (3) analysis at the cellular level of whole freeze-dried cells with scanning electro...
متن کاملBarriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy
Low voltage x-ray microanalysis, defined as being performed with an incident beam energy ≤5 keV, can achieve spatial resolution, laterally and in depth, of 100 nm or less, depending on the exact selection of beam energy and the composition of the target. The shallow depth of beam penetration, with the consequent short path length for x-ray absorption, and the low overvoltage, the ratio of beam ...
متن کاملElectron Probe Microanalysis (EPMA)
An electron microprobe is an electron microscope designed for the non-destructive x-ray microanalysis and imaging of solid materials. It is essentially a hybrid instrument combining the capabilities of both the scanning electron microscope (SEM) and an x-ray fluorescence spectrometer (XRF), with the added features of fine-spot focusing (~ 1 micrometer), optical microscope imaging, and precision...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2006
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927606064841